i

Title of the course

MM 732: Structural Characterization of Materials

ii

Credit structure

L          T          P          C

0           0          3           3

iii

Pre-requisite, if any

None

iv

Course content

Optical microscopy ?? different modes of microscopy, image analysis Scanning electron microscopy ?? secondary electron and backscattered electron imaging, EDS/EPMA X-ray diffraction ?? indexing of XRD patterns, Intensity calculations, particle size effects, lattice parameter determination

v

Texts/References

B. D. Cullity and S. R. Stock, Elements of X-ray Diffraction, Prentice Hall; 3 ed., 2001R. Egerton, Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, andAEM, Springer, 1st ed. 2005R. Haynes, Optical Microscopy of Materials, Springer, 1984

vi

Instructor(s) name

Prof. Ashutosh Gandhi