i

Title of the course

MM 206 :  Experimental Techniques in Materials Science     

ii

Credit structure

L          T          P          C

2           1          0           6

iii

Pre-requisite, if any

None

iv

Course content

Properties of Electromagnetic radiation, interaction of EM radiation with matter, absorption, scattering, diffraction, polarization, excitation and de-excitation. Experimental techniques and analysis of materials through X-ray scattering techniques: powder method, Laue method, crystal structure determination.  Phase diagram determination; X-ray stress measurements; X-ray spectroscopy;   Scanning techniques (SEM, AFM, STM); Optical microscopy; optical and vibrational spectroscopy.

Experimental methods in materials properties measurements: electrical, thermal, magnetic, mechanical and optical.

v

Texts/References

H.H. Willard, L.L. Merritt, J.A. Dean and F.A. Settle, Instrumental Methods of Analysis, 6^th Ed., C.B.S. Publishers, New Delhi, 1991.

Metals Handbook Vol. 9, Characterization of Materials, 10^th Ed., American Soc. of Metals, Metals Park, Ohio, 1986.

G.A. Higgerson, Experiments in Materials Technology, Affiliated East-West Press, 1973.

L.C. Azzarof, Elements of X-ray Crystallography, McGraw-Hill, New York, 1968.

M.V. Heimendahl, Electron Microscopy of Materials-An Introduction, Academic Press, 1980.

vi

Instructor(s) name

Prof. Parag Bhargava